About 300 papers concerned with the measurement and interpretation of carrier lifetime in semiconductors are listed together with key words and a brief comment for each. Eight types of entries are included: Description of Methods, Analysis of Results, S Topic: Semiconductors--Bibliography.
About 130 papers which deal with the measurement techniques useful in detecting the type and location of various inhomogeneities, primarily in germanium and silicon, are listed with key words. The types of inhomogeneities considered are those in impurity Topic: Semiconductors--Bibliography.
Extensive tables of the geometrical correction factors for four-point probe resistivity measurements on thin, circular semiconductor samples with all surfaces insulating are given, (1) for an in-line probe array displaced radially with points along a diam Topics: Semiconductors., Electric resistance.